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GIST Scholar College of Artificial Intelligence Department of Electrical Engineering and Computer Science 1. Journal Articles

Thickness and Refractive Index Measurements by Full-Field Optical Coherence Microscopy

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Author(s)
Na, Jihoon; Choi, Woo June; Choi, Hae Young; Ryu, Seon Young; Choi, Eun Seo; Lee, Byeong Ha
Type
Article
Citation
IEEE Sensors Journal, v.9, no.12, pp.1996 - 1997
Issued Date
2009-12
Abstract
We present the noble sensing method that can simultaneously measure the physical thickness and the refractive index of a transparent specimen based on full-field optical coherence microscopy. As a sample, a small drop of epoxy was placed on a flat glass plate and high-resolution depth resolved en-face images were taken. With adopting the reference plane from a cross-sectional image, the physical thickness, and the refractive index distribution could be obtained.
Publisher
Institute of Electrical and Electronics Engineers
ISSN
1530-437X
DOI
10.1109/JSEN.2009.2031808
URI
https://scholar.gist.ac.kr/handle/local/16896
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