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Thermal measurements and analysis of AlGaInP/GaInP MQW red LEDs with different chip sizes and substrate thicknesses

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Abstract
Thermal properties of AlGaInP/GaInP MQW red LEDs are investigated by thermal measurements and analysis for different chip sizes and substrate thicknesses. To extract the thermal resistance (R-th), junction temperature (T-j) is experimentally determined by both forward voltage and electroluminescence (EL) emission peak shift methods. For theoretical thermal analysis, thermal parameters are calculated in simulation using measured heat source densities. The T-j value increases with increasing the injection current, and it decreases as the chip size becomes larger. The use of a thin substrate improves the heat removal capability. At 450 mA, the T-j of 315 K and 342 K are measured for 500 x 500 mu m(2) LEDs with 110 mu m and 350 mu m thick substrates, respectively. For 500 x 500 mu m(2) LEDs with 110 mu m thick substrate, the R-th values of 13.99 K/W and 14.89 K/W are obtained experimentally by the forward voltage and EL emission peak shift methods, respectively. The theoretically calculated value is 13.44 K/W, indicating a good agreement with the experimental results. (C) 2010 Elsevier Ltd. All rights reserved.
Author(s)
Lee, H. K.Lee, D. H.Song, Young MinLee, Yong TakYu, J. S.
Issued Date
2011-02
Type
Article
DOI
10.1016/j.sse.2010.10.007
URI
https://scholar.gist.ac.kr/handle/local/16445
Publisher
PERGAMON-ELSEVIER SCIENCE LTD
Citation
Solid-State Electronics, v.56, no.1, pp.79 - 84
ISSN
0038-1101
Appears in Collections:
Department of Electrical Engineering and Computer Science > 1. Journal Articles
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