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Electroluminescence enhancement of (11(2)over-bar2) semipolar GaN light-emitting diodes grown on miscut m-plane sapphire substrates

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Abstract
(11 (2) over bar2) semipolar GaN thin films were grown on intentionally miscut m-plane sapphire substrates using metal organic chemical vapor deposition. We investigated the material and electrical characteristics by changing the miscut angle from -1 degrees to +1 degrees. While the coexistence of (11 (2) over bar2) surface and inclined {10 (1) over bar} surfaces was observed on GaN films on the on-axis m-plane sapphire substrates, {10 (1) over bar} surfaces were dominant on the GaN films on the +1 degrees miscut sapphire substrates. As the miscut angle was changed from -1 degrees to +1 degrees, the crystallinity of the GaN films and the electroluminescence intensity of the LEDs were significantly improved. (C) 2011 Elsevier B.V. All rights reserved.
Author(s)
Bae, Si YoungLee, Dong-SeonKong, BohyunCho, Hyung KounKaeding, John F.Nakamura, ShujiDenBaars, Stephen P.Speck, James
Issued Date
2011-05
Type
Article
DOI
10.1016/j.cap.2011.01.001
URI
https://scholar.gist.ac.kr/handle/local/16337
Publisher
한국물리학회
Citation
Current Applied Physics, v.11, no.3, pp.954 - 958
ISSN
1567-1739
Appears in Collections:
Department of Semiconductor Engineering > 1. Journal Articles
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