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Relationship between phase and generation mechanisms of THz waves in InAs

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Abstract
We investigated the thickness-dependent characteristics of THz waves from InAs epilayers whose thickness ranges from 0.01 to 1.74 mu m. The amplitude showed monotonic increments up to 0.9 mu m, followed by a saturation at 1.74 mu m. Interestingly, the phase of THz waves was reversed around absorption depth and used to identify the transient dipole direction based on simulated band diagram. We could further distinguish dominant THz wave generation mechanisms, associated with the phase information. (C) 2011 Elsevier B. V. All rights reserved.
Author(s)
Jeong, HoonillShin, SanghoonKim, Sang YoonSong, JindongChoi, SangbaeLee, Dong-SeonLee, Jinho HJho, Young Dahl
Issued Date
2012-05
Type
Article
DOI
10.1016/j.cap.2011.10.002
URI
https://scholar.gist.ac.kr/handle/local/15962
Publisher
ELSEVIER
Citation
Current Applied Physics, v.12, no.3, pp.668 - 672
ISSN
1567-1739
Appears in Collections:
Department of Electrical Engineering and Computer Science > 1. Journal Articles
Department of Semiconductor Engineering > 1. Journal Articles
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