Demonstration of Addressable Organic Resistive Memory Utilizing a PC-Interface Memory Cell Tester
- Author(s)
- Cho, Byungjin; Song, Sunghoon; Ji, Yongsung; Choi, Ho-Gil; Ko, Heung Cho; Lee, Jae-Suk; Jung, Gun Young; Lee, Takhee
- Type
- Article
- Citation
- IEEE ELECTRON DEVICE LETTERS, v.34, no.1, pp.51 - 53
- Issued Date
- 2013-01
- Abstract
- We demonstrated nonvolatile 8 x 8 array organic memory devices utilizing a PC-interface memory cell tester. The organic memory devices composed of a Ag/poly(3-hexylthiophene-2,5-diyl) (P3HT)/p(+) poly-Si structure exhibited excellent memory performance properties, including stable switching behavior, proper statistical distribution, and long retention time. We succeeded in independently addressing and reading the data in the memory cell array using the PC-interface memory cell tester, opening an avenue toward more realistic organic memory device applications.
- Publisher
- Institute of Electrical and Electronics Engineers
- ISSN
- 0741-3106
- DOI
- 10.1109/LED.2012.2226231
- URI
- https://scholar.gist.ac.kr/handle/local/15704
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