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ZnO/p-GaN Heterostructure for Solar Cells and the Effect of ZnGa2O4 Interlayer on Their Performance

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Abstract
We report the usage of ZnO material as an alternative for n-GaN for realizing III-nitride based solar cell. The fabricated solar cell shows large turn-on voltage of around 8 volts and a rapid decrease of photocurrent at low bias voltage under darkness and 1-sun illumination conditions, respectively. This phenomenon can be attributed to the formation of high-resistive ultra-thin layers at the ZnO/p-GaN junction interface during high temperature deposition. Transmission electron microscopy (TEM) studies carried out on the grown samples reveals that the ultra-thin layer consists of ZnGa2O4. It is found that the presence of insulating ZnGa2O4 film is detrimental in the performance of proposed heterostructure for solar cells.
Author(s)
Nam, Seung YongChoi, Yong SeokLee, Ju HoPark, Seong-JuLee, Jeong YongLee, Dong-Seon
Issued Date
2013-01
Type
Article
DOI
10.1166/jnn.2013.6943
URI
https://scholar.gist.ac.kr/handle/local/15699
Publisher
American Scientific Publishers
Citation
Journal of Nanoscience and Nanotechnology, v.13, no.1, pp.448 - 451
ISSN
1533-4880
Appears in Collections:
Department of Materials Science and Engineering > 1. Journal Articles
Department of Semiconductor Engineering > 1. Journal Articles
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