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Direct patterning of sol-gel metal oxide semiconductor and dielectric films via selective surface wetting

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Abstract
We report the simple, photolithography-free, direct patterning of both solution-processed metal oxide semiconductors and dielectrics via selective surface wetting. This technique was directly applied to fabrication of low-voltage all-solution metal oxide thin-film transistors with minimal channel and gate leakage currents.
Author(s)
Sung, SujinPark, SungjunCha, SeungbokLee, Won-JuneKim, Chang-HyunYoon, Myung-Han
Issued Date
2015-01
Type
Article
DOI
10.1039/c5ra04515k
URI
https://scholar.gist.ac.kr/handle/local/14900
Publisher
ROYAL SOC CHEMISTRY
Citation
RSC ADVANCES, v.5, no.48, pp.38125 - 38129
ISSN
2046-2069
Appears in Collections:
Department of Materials Science and Engineering > 1. Journal Articles
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