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Stuck-at-Fault Tolerant Schemes for Memristor Crossbar Array-Based Neural Networks

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Abstract
In this study, a circuit technique and training algorithm that minimizes the effect of stuck-at-faults (SAFs) within a memristor crossbar array of neural networks (NNs) are presented. To improve the network performance in the presence of SAFs, a conventional transimpedance amplifier, which is used for summing the currents that flow through the memristors, is modified to ensure that the amplifier output is within the appropriate operating range. Further improvement in the network performance is achieved by using the proposed training algorithm, which utilizes the locations and values of faulty memristors for network training. A feedforward NN employing 32 x 32 memristor crossbar arrays is implemented to verify the performance improvement in the NNs using the proposed circuit technique and training algorithm.
Author(s)
Yeo, InjuneChu, MyonglaeGi, Sang-GyunHwang, HyunsangLee, Byung-Geun
Issued Date
2019-07
Type
Article
DOI
10.1109/TED.2019.2914460
URI
https://scholar.gist.ac.kr/handle/local/12639
Publisher
Institute of Electrical and Electronics Engineers
Citation
IEEE Transactions on Electron Devices, v.66, no.7, pp.2937 - 2945
ISSN
0018-9383
Appears in Collections:
Department of Electrical Engineering and Computer Science > 1. Journal Articles
Department of Materials Science and Engineering > 1. Journal Articles
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