Derivation of a Universal Charge Model for Multigate MOS Structures With Arbitrary Cross Sections
- Author(s)
- Lee, Kwang-Woon; Hong, Sung-Min
- Type
- Article
- Citation
- IEEE Transactions on Electron Devices, v.69, no.6, pp.3014 - 3021
- Issued Date
- 2022-06
- Abstract
- A universal equation for the charge-voltage characteristics in the multigate metal oxide semiconductor (MOS) structure with an arbitrary cross section is presented. A generalized coordinate is proposed and the Poisson equation is integrated with a weighting factor related with the generalized coordinate and the electric field. A compact charge model is derived and analytic and numerical examples for various MOS structures are shown.
- Publisher
- Institute of Electrical and Electronics Engineers
- ISSN
- 0018-9383
- DOI
- 10.1109/TED.2022.3164862
- URI
- https://scholar.gist.ac.kr/handle/local/10796
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