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Derivation of a Universal Charge Model for Multigate MOS Structures With Arbitrary Cross Sections

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Author(s)
Lee, Kwang-WoonHong, Sung-Min
Type
Article
Citation
IEEE Transactions on Electron Devices, v.69, no.6, pp.3014 - 3021
Issued Date
2022-06
Abstract
A universal equation for the charge-voltage characteristics in the multigate metal oxide semiconductor (MOS) structure with an arbitrary cross section is presented. A generalized coordinate is proposed and the Poisson equation is integrated with a weighting factor related with the generalized coordinate and the electric field. A compact charge model is derived and analytic and numerical examples for various MOS structures are shown.
Publisher
Institute of Electrical and Electronics Engineers
ISSN
0018-9383
DOI
10.1109/TED.2022.3164862
URI
https://scholar.gist.ac.kr/handle/local/10796
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