Laser-induced X-ray fluorescence and electron-based X-ray emission analysis of multi-layer material

Abstract

In this study, we analyzed the X-ray fluorescence of the multi-layer material with a laser-induced X-ray and electrons. The laser plasma-based sources were generated by the femtosecond Ti: sapphire laser source, and we optimized sources for the X-ray fluorescence measurement. The laser-induced X-ray fluorescence of three types of stainless steel, copper-covered stainless steel and three types of Korean 10 Won coins were measured using a compact laser with relatively low intensity. Using the difference in penetration depth between X-rays and electrons, the surface and interior of multi-layer materials can be analyzed simultaneously. By combining these two complementary sources, we can provide valuable information about the surface and interior of multi-layer materials even with the compact laser.