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1 Article Effect of Bias Potential on the Interface of a Solid Electrolyte and Electrode during XPS Depth Profiling Analysis Seo, Minsik ; Lee, Yonghee ; Shin, Hyunsuk ; et al 2024-05
2 Article Voltage contrast inspection of an electrical defect on a semiconductor wafer with X-ray photoelectron spectroscopy and an electron beam Seo, Minsik ; Chae, Hong Chol ; Kim, Kyungmin ; et al 2025-04

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